E-Learning Now Available

Scytec Blog

Scytec has launched a new E-Learning online portal for our manufacturing machine monitoring software, DataXchange. The wide range of topics covered will have educational courses for all shop personnel. After completing this series, the user should be able to achieve the benefits of increased utilization and decreased downtime with proper use of the system. E-Learning is a sequence of virtual courses that...

In DataXchange two commonly used reports and charts are the Equipment Status Summary and the Target Utilization. The Equipment Status Summary shows the statuses that have occurred over the period of time selected, while the Target Utilization shows the utilization percent relative to a target. A common question is whether or not the percent of cycle time in the Equipment Status...

The custom reports, charts and dashboard in Scytec DataXchange is a leading feature of the software. DataXchange reporting contains a variety of Utilization, OEE and IIoT reports and charts to help reduce machine downtime and increase overall equipment effectiveness. Types of custom reports include: Equipment Status Summaries OEE Summaries Downtime Pareto Scrap Pareto Plots Histograms Comparison Timelines Trends In our latest software...

In the past calculating utilization for stations such as paint booths or powder coating lines that use overhead conveyors wasn’t very accurate.  A rudimentary method was simply to monitor whether the conveyor was moving.  However, this did not consider multiple factors including whether any parts were actually present on the conveyor.  An improvement was to add a digital sensor to detect...

Good data is the key to improving manufacturing performance and cutting costs. With good data you can maximize bottleneck utilization, measure OEE accurately, use resources more efficiently and find and reduce waste. The challenge is, how do you capture that good data? Here we’ll explore the importance of manufacturing data collection, the difference between good and bad quality data, and how...